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Ion beam analysis
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21	IAEA-TECDOC[removed]Ion beam techniques for the analysis of light elements in thin films, including depth profiling Final report of a co-ordinated research project Add to Reading List Source URL: www-pub.iaea.org Language: English - Date: 2004-11-04 08:25:25 Chemistry Rutherford backscattering spectrometry Elastic recoil detection Particle-induced X-ray emission Ion implantation Nuclear reaction analysis Thin film Nuclear data Ion beam analysis Materials science Physics Science
22	XRF Newsletter A newsletter of the IAEA’s Laboratories, Seibersdorf Issue No. 11, July 2006 X ray Fluorescence in the IAEA and its Add to Reading List Source URL: www-pub.iaea.org Language: English - Date: 2006-08-30 10:51:38 Spectroscopy Materials science Microtechnology X-ray fluorescence Particle-induced X-ray emission XRF Ion beam analysis SPECTRO Analytical Instruments Nuclear microscopy Physics Science Scientific method
23	Microsoft Word - XRF Newsletter 26.docx Add to Reading List Source URL: www-pub.iaea.org Language: English - Date: 2014-08-29 03:10:29 Spectroscopy Materials science X-ray spectroscopy X-ray fluorescence PANalytical SPECTRO Analytical Instruments Analytical chemistry Mass spectrometry Ion beam analysis Physics Scientific method Science
24	Microsoft PowerPoint - IonBeamsAccelerators26Jul13.ppt [Compatibility Mode] Add to Reading List Source URL: www.ansto.gov.au Language: English - Date: 2013-08-08 19:13:26 Particle accelerators Materials science Mass spectrometry Ions Nuclear physics Ion beam analysis Particle-induced X-ray emission Accelerator mass spectrometry Ion source Physics Chemistry Scientific method
25	Fraunhofer Institute for Reliability and M i c r o i n t e g r at i o n I Z M Focused Ion Beam • Design parameter effect analysis (geometry, material, load profile) Add to Reading List Source URL: www.izm.fraunhofer.de Language: English - Date: 2015-03-18 10:12:33 Reliability Measuring instrument Thermomechanical analysis Failure analysis Electron microscope Dynamic mechanical analysis Atomic force microscopy Characterization MIL-STD-883 Science Materials science Scientific method
26	Summary of "IAEA intercomparison of IBA software" N.P. Barradas a,b, , K. Arstila c, G. Battistig d, M. Bianconi e, N. Dytlewski f, C. Jeynes g,, E. Kótai h, G. Lulli e, M. Mayer i, E. Rauhala j, E. Szilágyi h, M. Th Add to Reading List Source URL: epubs.surrey.ac.uk Language: English* - Date: 2013-09-23 15:39:52 Particle physics Condensed matter physics Scattering Rutherford backscattering spectrometry Ion beam analysis Elastic recoil detection Nuclear reaction analysis Binary collision approximation Cross section Physics Materials science Nuclear physics
27	The effect of matrix electron affinity on ion beam currents for BeO analysis A.L. Hunt, G.A. Petrucci: Department of Chemistry, University of Vermont; P.R. Bierman Department of Geology and School of Natural Resources, U Add to Reading List Source URL: www.uvm.edu Language: English - Date: 2010-09-20 14:03:09 Mass spectrometry Ions Particle accelerators Semiconductor device fabrication Thin film deposition Ion source Ion beam Electron Accelerator mass spectrometry Chemistry Physics Scientific method
28	An Implementation for the Detection and Analysis of Negative Peaks in an Applied Current Signal across a Silicon Nanopore Joseph A. Billoa,b, Waseem Asghara,b and Samir M. Iqbala,b,c Department of Electrical Engineering Add to Reading List Source URL: www.uta.edu Language: English* - Date: 2011-06-06 18:22:48 Nanopore Physics Ion-beam sculpting Window function Noise Amplitude Nanopore sequencing Izon Science Nanotechnology Science Mathematical analysis
29	Fraunhofer Institute for Reliability and M i c r o i n t e g r at i o n I Z M Focused Ion Beam • Design parameter effect analysis (geometry, material, load profile) Add to Reading List Source URL: www.izm.fraunhofer.de Language: English - Date: 2015-02-12 09:57:08 Reliability Measuring instrument Thermomechanical analysis Failure analysis Electron microscope Dynamic mechanical analysis Atomic force microscopy Characterization MIL-STD-883 Science Materials science Scientific method
30 $Semiconductor device fabrication / Thin film deposition / Electron beam / Focused ion beam / Failure analysis / Electron beam induced current / Electron microscope / Scanning electron microscope / Electron backscatter diffraction / Scientific method / Science / Electron microscopy$	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:29:23 Semiconductor device fabrication Thin film deposition Electron beam Focused ion beam Failure analysis Electron beam induced current Electron microscope Scanning electron microscope Electron backscatter diffraction Scientific method Science Electron microscopy

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